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光学仪器及设备
X射线无散射针孔SCATEX
X射线双曲弯晶
EUV多层膜反射镜
XUV滤光片
X射线菲涅耳波带片(FZP)
greateyes ALEX 2048 512 CCD相机
XOS多毛细管X光透镜
Greateyes软x射线CCD相机ALEXi
Greateyes可见光CCD相机成像系列
Greateyes全帧CCD相机光谱系列
X射线仪器
X-Spectrum兆赫兹X射线探测器SPARTA
Advacam光子计数X射线探测器WidePIX 2(1)x10-MPX3
Advacam掌上光子计数X射线探测器MiniPIX EDU
Advacam光子计数型X射线探测器MiniPIX TPX
光子计数型X射线探测器MiniPIX TPX3
XOS单色K-alpha微焦点x射线源
XOS多毛细管微焦点X射线源
Adcavam-光子计数X射线探测器WidePIX 5X5
实验室级HPC(Timepix)探测器
X-spectrum光子计数X射线探测器LAMBDA 2M
实验室服务
GDMS增值服务
X射线光学组件调试
X射线源类特色服务
软件发开
清洗服务
光谱检测分析仪
Enspectr低波数拉曼显微镜
便携式激光拉曼扫描分析仪
手持式拉曼光谱仪RaPort
便携式拉曼光谱仪-EnSpectr R532
拉曼显微镜RamMics M532
质谱检测分析仪
高分辨辉光放电质谱仪Autoconcept GD90
气质联用双聚焦磁质谱AUTOCONCEPT GC-MS
超快飞行时间质谱仪Elsima TOF
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The term “special crystals” refers to crystal types and multilayers that are not used universally but are
employed in special applications.
LiF(420):
See, for example, “standard types” description of the LiF crystals (200, 220 and 420).
Ge:
A very good crystal for measuring the elements S, P and Cl. In comparison to PET, Ge is characterized
by a higher dispersion and a more stable temperature behavior. Ge suppresses the peaks of the 2nd and
4th order, in particular.
Ge is especially suitable for differentiating between sulphide and sulphate, such as in samples of cement.
Introduction to X-Ray Fluorescence (XRF) Fundamental Principles
ADP:
In practice, ADP is only used for the analysis of Mg and has a higher resolution with a significantly lower
reflectivity compared to the multilayer XS-55. ADP is therefore required where interference peaks can
occur such as in the case of low Mg concentrations in an Al matrix.
TlAP:
TlAP has high resolution but low reflectivity and is recommended for analyzing F and Na if the resolution
of XS-55 is insufficient (e.g. where Na is overlapped by the Zn-L peaks in Zn-rich samples).
DANGER
Disadvantages are the limited lifetime, toxicity, and high price.
InSb:
InSb is a very good crystal for analyzing Si in traces as well as in higher concentrations (e.g. glass). It
replaces PET and is used wherever high precision and great stability is required. The disadvantages are
the limited use (only Si) and the high price.
XS-N:
XS-N is a multilayer with a 2d-value of 11.0 nm, specially optimized for nitrogen.
XS-C:
XS-C is a multilayer with a 2d value of 12.0 nm, specially optimized for carbon.
XS-B:
XS-B is a multilayer with a 2d-value of 19.0 nm, specially optimized for boron and is equally suitable for
the analysis of beryllium.