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光学仪器及设备
X射线无散射针孔SCATEX
X射线双曲弯晶
EUV多层膜反射镜
XUV滤光片
X射线菲涅耳波带片(FZP)
greateyes ALEX 2048 512 CCD相机
XOS多毛细管X光透镜
Greateyes软x射线CCD相机ALEXi
Greateyes可见光CCD相机成像系列
Greateyes全帧CCD相机光谱系列
X射线仪器
X-Spectrum兆赫兹X射线探测器SPARTA
Advacam光子计数X射线探测器WidePIX 2(1)x10-MPX3
Advacam掌上光子计数X射线探测器MiniPIX EDU
Advacam光子计数型X射线探测器MiniPIX TPX
光子计数型X射线探测器MiniPIX TPX3
XOS单色K-alpha微焦点x射线源
XOS多毛细管微焦点X射线源
Adcavam-光子计数X射线探测器WidePIX 5X5
实验室级HPC(Timepix)探测器
X-spectrum光子计数X射线探测器LAMBDA 2M
实验室服务
GDMS增值服务
X射线光学组件调试
X射线源类特色服务
软件发开
清洗服务
光谱检测分析仪
Enspectr低波数拉曼显微镜
便携式激光拉曼扫描分析仪
手持式拉曼光谱仪RaPort
便携式拉曼光谱仪-EnSpectr R532
拉曼显微镜RamMics M532
质谱检测分析仪
高分辨辉光放电质谱仪Autoconcept GD90
气质联用双聚焦磁质谱AUTOCONCEPT GC-MS
超快飞行时间质谱仪Elsima TOF
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Multilayers XS-55, XS-N, XS-C, XS-B
Multilayers are not natural crystals but artificially produced “layer analyzers.” The lattice plane distances d
are produced by applying thin layers of two materials in alternation onto a substrate (Fig. 18). Multilayers
are characterized by high reflectivity and a somewhat reduced resolution. For the analysis of light
elements the multilayer technique presents an almost revolutionary improvement for numerous
applications in comparison to natural crystals with large lattice plane distances.
Fig. 18: Diffraction in the layers of a multilayer crystal
XS-55:
The most commonly used multilayer with a 2d-value of 5.5 nm for analyzing the elements N to Al and Ca
to Br; standard application for measuring the elements F, Na and Mg.